Accelerated X-Ray Analysis for Nanoscale Imaging (XANI) of Novel Materials
A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors,...A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors, batteries, and catalysis. It produces ultrashort X-ray pulses that can record the movements of atoms and electrons. These instruments can detect the smallest change in material structure caused by defects and other influences.